Failure phenomena and mechanisms of polymeric light-emitting diodes: Indium–tin–oxide damage
- 4 November 1996
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 69 (19) , 2894-2896
- https://doi.org/10.1063/1.117354
Abstract
Indium–tin–oxide (ITO) coated on a glass plate as the transparent electrode in polymeric light-emitting diodes (LEDs) generates some volcano-like patterns during use especially at a higher applied electric field strength. Such an ITO damage phenomenon is independent of Joule heat, conjugation structure of the polymer, and light-emission process, but only dependent on the applied electric field strength. The ITO damage, which results from a self-decomposition reaction, can cause a reduction of lifetime of the device.Keywords
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