X-ray emission spectroscopy—part I

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Abstract
Summary of Part I: The detection of X-rays by photographic recording, ionization chambers, proportional counters, scintillation counters, and semiconductor detectors is discussed. The extraordinary improvement in resolution achieved by semiconductor detectors resulted in a new powerful analytical method: detection of characteristic X-rays. Sample excitation, by X-rays, by charged particles produced by accelerators and by radioactive sources, is discussed. Charged particle induced X-ray emission is described within B framework of simple theoretical models. Experimental data on yields of X-rays produced by proton and heavy ion bombardment of different targets are summarized. The cross sections for the production of X-rays in ion-atom collisions are large. This allows the detection of elements present in very small amounts within the target, as well as the measurement of the charge of particles using beam foil spectroscopy. Part II of this article will describe some applications of X-ray emission spectroscopy in industry, water and air pollution, and in the study of the importance of trace elements in biology and medicine. Sensitivity, background problems, target preparation and data reduction for X-ray emission spectroscopy will be discussed.

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