Tension annealing cold-drawn amorphous CoFeSiB wires
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 26 (5) , 1795-1797
- https://doi.org/10.1109/20.104528
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Bistable magnetization reversal in 50 µm diameter annealed cold-drawn amorphous wiresIEEE Transactions on Magnetics, 1987
- Influence of applied tensile and compressive stress on large Barkhausen and Matteucci effects in amorphous wiresIEEE Transactions on Magnetics, 1986
- Large Barkhausen effect and Matteucci effect in amorphous magnetostrictive wires for pulse generator elementsIEEE Transactions on Magnetics, 1985