A goniometer for electron microscopy at 1.6 Å point-to-point resolution

• 1 June 1979
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 12  (3) , 279-286
• https://doi.org/10.1107/s0021889879012474

Abstract

Keywords

• EXPERIMENTAL
• LENS
• RESOLUTION
• POINT TO POINT
• POLE
• GONIOMETER
• ULTRA
• MICROGRAPHS
• PIECES