Twinning study of CdTe epitaxic layer by X-ray ι-scan measurement

• 1 August 1993
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 26  (4) , 570-573
• https://doi.org/10.1107/s0021889893001517

Abstract

Keywords

• TWIN STUDY