Surface oxidation of Permalloy thin films
- 24 January 2006
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 73 (1) , 014420
- https://doi.org/10.1103/physrevb.73.014420
Abstract
The chemical and magnetic structures of oxides on the surface of Permalloy films were investigated as functions of annealing time with x-ray and polarized neutron reflectometry. For annealing times of less than one hour, the oxide consisted of a 1.5-nm-thick layer of on an Fe oxide layer that was in contact with Permalloy. The Fe oxide thickness increases with annealing time with a parabolic rate constant of (for an annealing temperature of ). The growth of the oxide layer is limited by the rate at which oxygen appears below the layer. No portion of the oxide region was found to be ferromagnetically ordered for films annealed less than one hour. The growth of the Fe oxide region is well correlated with the measured increase of the second-order magnetic susceptibility for similarly prepared samples.
Keywords
This publication has 27 references indexed in Scilit:
- Second-harmonic magneto-optic Kerr effect from spin-valve test structures: correlation with magnetoresistance responseIEEE Transactions on Magnetics, 1997
- Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structuresApplied Physics Letters, 1996
- Transverse and longitudinal second-harmonic magneto-optic Kerr effect from Ni/sub 81/Fe/sub 19/ thin film structuresIEEE Transactions on Magnetics, 1996
- Domain topography of antiferromagnetic Cr2O3 by second-harmonic generationApplied Physics Letters, 1995
- Observation of Large Kerr Angles in the Nonlinear Optical Response from Magnetic MultilayersPhysical Review Letters, 1995
- Magnetisatization-induced optical second-harmonic generation: A probe for interface magnetismPhysical Review B, 1994
- Optical second-harmonic generation from magnetized surfacesPhysical Review B, 1989
- Polarized neutron reflectometer: A new instrument to measure magnetic depth profilesReview of Scientific Instruments, 1987
- Effects of Oxidation on the Atmospheric Corrosion of Permalloy FilmsJournal of the Electrochemical Society, 1979
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954