Short Channel MOS FET's Fabricated by Self-Aligned Ion Implantation and Laser Annealing

Abstract
Short channel MOS FET's are successfully fabricated by a combination of selfaligned ion implantation and laser annealing, both of poly-Si gate electrodes. The threshold voltage vs. gate length relation and the overlapping capacitance between gate and drain are improved as a result of the extremely small lateral diffusion of implanted atoms.

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