Analysis strategy for internal measurements on VLSI devices
- 31 December 1987
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 6 (1-4) , 23-28
- https://doi.org/10.1016/0167-9317(87)90014-1
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Electron beam testingMicroelectronic Engineering, 1986
- Laser cutting of aluminium stripes for debugging integrated circuitsIEEE Journal of Solid-State Circuits, 1985