Kerr rotation and perpendicular magnetic anisotropy of CoCr films with Al ultrathin interlayers and single-layer CoCr films

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Abstract
The Co81Cr19/Al multilayered films were prepared by using the plasma‐free sputtering apparatus. The specimen films with the thicknesses of Co81Cr19 and Al layers lCo‐Cr and lAl of 50–170 and 7–14 Å, respectively, were investigated for the Kerr rotation angle θK and the reflectance R of the multilayered films with total thickness of 1500 Å. Films with lCo‐Cr and lAl of 138 and 7 Å, respectively, had a θK of 0.21° and R of 0.7 which is larger than Co81Cr19 single‐layer films prepared by conventional sputtering where θK and R are 0.036° and 0.4–0.5, respectively. These results indicate that the films were entirely homogeneous, that is, the surface and interior of the films may be almost the same for composition, microstructure and magnetic properties. Consequently, the Co81Cr19 thin films with Al ultrathin interlayers may be useful for microcrystalline magneto‐optical media with a high C/N ratio.