Method of determining tip structure in atomic force microscopy
- 15 August 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 44 (7) , 3272-3276
- https://doi.org/10.1103/physrevb.44.3272
Abstract
The stability of single atomic tip is tested using molecular-dynamics simulation. Many metallic single-atomic tips are unstable during the scan at a tip load well below typical experimental values. For the bcc W(111) tip, second-layer-tip-atomic contributions are comparable to the first-layer contribution. These results suggest that experimentally multiple-atom tips are involved in the scanning process. We propose a method to identify tip size and structure during the scanning process. The resultant images for a number of commonly used tip materials are interpreted and compared to experiments.Keywords
This publication has 28 references indexed in Scilit:
- Erratum: ‘‘New calculations method for expitaxial energy: Application to an axial commensurate interface [Phys. Rev. Lett. 64, 1923 (1990)]Physical Review Letters, 1991
- New calculational method for epitaxial energy: Application to an axial commensurate interfacePhysical Review Letters, 1990
- Simple theory for the atomic-force microscope with a comparison of theoretical and experimental images of graphitePhysical Review B, 1989
- Crystal-melt and melt-vapor interfaces of nickelPhysical Review B, 1989
- Scanning-tunneling microscopy at small tip-to-surface distancesPhysical Review B, 1987
- Erratum: Voltage-dependent scanning-tunneling microscopy of a crystal surface: GraphitePhysical Review B, 1986
- Voltage-dependent scanning-tunneling microscopy of a crystal surface: GraphitePhysical Review B, 1985
- Scanning tunneling microscopyPhysica B: Condensed Matter, 1984
- Interatomic potentials for alkali metals. A comparative studyPhysica Status Solidi (b), 1978
- Calculation of potential energy parameters form crystalline state propertiesPhysica Status Solidi (a), 1975