Spatial resolution in selected-area EELS
- 31 July 1994
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 55 (1) , 31-41
- https://doi.org/10.1016/0304-3991(94)90078-7
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- The chromatic image shift in spatially resolved EELSUltramicroscopy, 1994
- A brief look at imaging and contrast transferUltramicroscopy, 1992
- The influence of lens chromatic aberration on electron energy-loss spectroscopy quantitative measurementsMicroscopy Research and Technique, 1992
- On the effect of objective lens chromatic aberration on quantitative Electron-Energy-Loss Spectroscopy (EELS)Ultramicroscopy, 1989
- Accuracy in microanalysis by electron energy-loss spectroscopyJournal of Research of the National Bureau of Standards, 1988
- An improved method for computing a discrete Hankel transformComputer Physics Communications, 1987
- Theory of Image Formation by Inelastically Scattered Electrons in the Electron MicroscopePublished by Elsevier ,1985
- Image formation by inelastically scattered electrons: Image of a surface plasmonUltramicroscopy, 1983
- Inelastic scattering and energy filtering in the transmission electron microscopePhilosophical Magazine, 1976
- Image Formation in the Electron Microscope with Particular Reference to the Defects in Electron-Optical ImagesPublished by Elsevier ,1973