Fringing Field Effect in the Lumped-Capacitance Method for Permittivity Measurement

1 March 1978

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement

Vol. 27 (1) , 107-109
https://doi.org/10.1109/tim.1978.4314631

Abstract

Theoretical analysis of the fringing field effect in the lumped-capacitance method for permittivity measurement for both shunt- and series-capacitor methods is given. It is shown that while the measured real part of the complex permittivity is larger than the true value by a factor depending on the ratio of the fringing to the parallel-plate capacitances, the imaginary part is not affected by the fringing field.

Keywords

This publication has 5 references indexed in Scilit:

A Lumped Capacitance Method for the Measurement of the Permittivity and Conductivity in the Frequency and Time Domain-A Further Analysis
IEEE Transactions on Instrumentation and Measurement, 1975
Theoretical analysis of the lumped capacitance method in dielectric time domain spectroscopy
Advances in Molecular Relaxation Processes, 1974
Permittivity Measurements at Microwave Frequencies Using Lumped Elements
IEEE Transactions on Instrumentation and Measurement, 1974
A Time-Domain Technique for Measurement of the Dielectric Properties of Biological Substances
IEEE Transactions on Instrumentation and Measurement, 1972
The Numerical Solution of Some Important Transmission-Line Problems
IEEE Transactions on Microwave Theory and Techniques, 1965