Investigation of Relationship between Hot Carrier Degradation and Kink Effect in Low Temperature Poly-Si TFTs
- 1 January 1999
- journal article
- Published by Wiley in SID Symposium Digest of Technical Papers
- Vol. 30 (1) , 452-455
- https://doi.org/10.1889/1.1834054
Abstract
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This publication has 1 reference indexed in Scilit:
- Remarks by Gary N. HorlickProceedings of the ASIL Annual Meeting, 1997