Interface microstructure of titanium thin-film/silicon single-crystal substrate correlated with electrical barrier heights
- 15 July 1991
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 70 (2) , 827-832
- https://doi.org/10.1063/1.349641
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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