Ellipsometry—LEED study of the adsorption of oxygen on (011) tungsten
- 1 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 251-264
- https://doi.org/10.1016/0039-6028(69)90022-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Ellipsometry, low-energy electron diffraction and field electron microscopy combinedSurface Science, 1968
- Commentaire sur “the uncertainty regarding reconstructed surfaces” by L. H. Germer and by E. BauerSurface Science, 1968
- Diffraction study of oxygen adsorption on a (110) tungsten faceSurface Science, 1966
- On the Use of Ellipsometry for Adsorption Measurements below Monolayer CoverageThe Journal of Physical Chemistry, 1966
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963