Atomic migration and related changes in defect concentration and structure due to electronic subsystem excitations in semiconductors
Open Access
- 1 January 1997
- journal article
- Published by Uspekhi Fizicheskikh Nauk (UFN) Journal in Uspekhi Fizicheskih Nauk
- Vol. 167 (4) , 407-412
- https://doi.org/10.3367/ufnr.0167.199704c.0407
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: