Characterization by X-ray topography of subsurface deformation in abrasive wear
- 1 February 1983
- Vol. 84 (3) , 387-392
- https://doi.org/10.1016/0043-1648(83)90279-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X-ray measurement of minute lattice strain in perfect silicon crystalsZeitschrift für Kristallographie - Crystalline Materials, 1981
- Crystal subgrain misorientations observed by X-ray topography in reflectionJournal of Applied Crystallography, 1980
- Surface structure in an abraded titanium alloyWear, 1980
- APPLICATION OF X-RAY TOPOGRAPHY TO THE ANALYSIS OF THE DISLOCATION ARRANGEMENT IN DEFORMED COPPER SINGLE CRYSTALSCanadian Journal of Physics, 1967