Negative Capacitance of Silicon Diode with Deep Level Traps
- 1 July 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (7) , 1423
- https://doi.org/10.1143/jjap.19.1423
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Admittance of p-n junctions containing trapsSolid-State Electronics, 1972