Coherency strains and growth of artificially modulated Cu-Ni thin films
- 16 June 1988
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 107 (2) , 579-587
- https://doi.org/10.1002/pssa.2211070212
Abstract
No abstract availableKeywords
This publication has 39 references indexed in Scilit:
- STRUCTURE OF CHEMICALLY MODULATED FILMSPublished by Elsevier ,1985
- DEFECTS IN EPITAXIAL DEPOSITSPublished by Elsevier ,1975
- X-Ray Diffraction by Multilayered Thin-Film Structures and Their DiffusionJournal of Applied Physics, 1967
- INTERDIFFUSION IN Au–Ag ALLOYS AT LOW TEMPERATURESApplied Physics Letters, 1966
- Divergent pearlite in a manganese eutectoid steelActa Metallurgica, 1963
- On spinodal decomposition in cubic crystalsActa Metallurgica, 1962
- On spinodal decompositionActa Metallurgica, 1961
- Free Energy of a Nonuniform System. I. Interfacial Free EnergyThe Journal of Chemical Physics, 1958
- One-dimensional dislocations. II. Misfitting monolayers and oriented overgrowthProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1949
- An X-Ray Method of Determining Rates of Diffusion in the Solid StateJournal of Applied Physics, 1940