Characterization of > 300 GHz Transistors Using a Novel Optoelectronic Network Analyzer
- 1 January 1998
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Optoelectronic techniques for ultrafast device network analysis to 700 GHzOptical and Quantum Electronics, 1996