Escape peaks and internal fluorescence in X-ray spectra recorded with lithium drifted silicon detectors
- 1 June 1972
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 5 (6) , 582-583
- https://doi.org/10.1088/0022-3735/5/6/029
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Calculation of the escape peak for GeLi and NaI radiation detectorsNuclear Instruments and Methods, 1971
- High resolution spectrometry with nuclear radiation detectorsNuclear Instruments and Methods, 1971
- Si(Li) spectrometers for electrons and low-energy photonsNuclear Instruments and Methods, 1971
- Atomic Fluorescence YieldsReviews of Modern Physics, 1966