Modeling and simulation of coupled lossy lines for VLSI interconnections
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Analysis of transients in nonuniform and uniform multiconductor transmission linesIEEE Transactions on Microwave Theory and Techniques, 1989
- Spectral technique in electronic circuit analysisInternational Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 1988
- The spectral discretization of transmission line systemMicrowave and Optical Technology Letters, 1988
- Electrical Performance of High-Speed Interconnect SystemsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1987
- Time-domain response of multiconductor transmission linesProceedings of the IEEE, 1987
- Analysis of Lossy Transmission Lines with Arbitrary Nonlinear Terminal NetworksIEEE Transactions on Microwave Theory and Techniques, 1986
- Multiconductor Transmission Lines In Multilayered Dielectric MediaIEEE Transactions on Microwave Theory and Techniques, 1984
- Coupled Lossy Transmission Line Characterization and SimulationIBM Journal of Research and Development, 1981
- Formulas for the Skin EffectProceedings of the IRE, 1942