Extreme value statistics in silicon photonics

1 November 2008

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

No. 10928081,p. 310-311
https://doi.org/10.1109/leos.2008.4688614

Abstract

We show that fluctuations of Raman amplified pulses, in the presence of a noisy pump, follow extreme value statistics, and provide mathematical insight into the origin of this perplexing behavior.

Keywords

STATISTICS
SILICON
PHOTONICS
PULSE AMPLIFIERS
FLUCTUATIONS
STATISTICAL DISTRIBUTIONS
LASER EXCITATION
PUMP LASERS
RICIAN CHANNELS
STIMULATED EMISSION

All Related Versions

Version 1, 2008-08-31, ArXiv (Unconfirmed version)

This publication has 2 references indexed in Scilit:

Optical rogue waves
Nature, 2007
Mathematical Analysis of Random Noise
Bell System Technical Journal, 1945