1fNoise from Thermal Fluctuations in Metal Films

The observed dependence of the $\frac{1}{f}$ noise in metal films on the temperature coefficient of resistance and on sample volume, and the observation of frequency-dependent spatial correlations of the noise, suggest the noise is due to a thermal-diffusion mechanism. The assumption of a spectrum for the intrinsic temperature fluctuations with an explicit $\frac{1}{f}$ region, and the condition $〈{\left(\Delta T\right)}^2〉=\frac{k{T}^2}{C_V}$, yield quantitative predictions of the noise power in excellent agreement with experiment.