Low-loss quasi-planar ridge waveguides formed on thin silicon-on-insulator

Abstract
Low-loss, quasi-planar ridge waveguide structures have been designed and fabricated in silicon-on-insulator material with waveguide propagation losses of < 0.7 dB ∕ cm at 1550 nm , and a Q ∼ 10 6 measured in a ring resonator configuration. These structures offer tight vertical field confinement with scalable bending losses, and should be of interest for integration with both active and passive components. Waveguides were fabricated using optical lithography and processing compatible with siliconelectronics.