X-ray Diffraction-Line Broadening Analysis: Paracrystalline Method

• 1 April 1997
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 30  (2) , 147-152
• https://doi.org/10.1107/s0021889896010023

Abstract

Keywords

• PROFILE SIMULATION
• LINE PROFILE
• POLYMERS
• SINGLE ORDER
• PARACRYSTALLINE
• RAY WIDE
• HOSEMANN
• WARREN AVERBACH
• ANGLE DATA
• LINE BROADENING