Application of a precise double X-ray spectrometer for accurate lattice parameter determination
- 16 January 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 21 (1) , 227-234
- https://doi.org/10.1002/pssa.2210210124
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Precision lattice constant determinationActa Crystallographica, 1960
- Intensity of X-ray reflexion from perfect and mosaic absorbing crystalsActa Crystallographica, 1950
- Shapes and Wavelengths ofSeries Lines of Elements Ti 22 to Ge 32Physical Review B, 1935