Direct morphological study of metal/polymer interfaces by scanning force microscopy
- 1 June 1995
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 23 (6) , 426-427
- https://doi.org/10.1002/sia.740230615
Abstract
No abstract availableKeywords
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- New semiconductor device physics in polymer diodes and transistorsNature, 1988
- Atomic Force MicroscopePhysical Review Letters, 1986