A versatile thin film method for quantitative X‐ray emission analysis

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Abstract
Liebhafsky and Zemany proposed two terms in X‐ray emission analysis: one is the linear thickness of a specimen below which the absorption effect vanishes; the other is the critical thickness of a specimen above which the specimen becomes infinitely thick. The criteria for these two terms are defined here in quantitative terms. A procedure for making thin films of closely controlled thickness is described. The sample is dispersed into a film‐forming polymer solution which contains an internal standard element. A thin film is made of this suspensoid by a film applicator. The internal standard element is used to correct for variation in actual film thickness. A single calibration curve can be used for samples of different matrices. Experimental data are presented to demonstrate the effectiveness of this thin‐film method in eliminating matrix effects.