Structural characterization of surfactant and clay-surfactant films of micrometer thickness by FT-IR spectroscopy
- 1 December 1993
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 9 (12) , 3649-3655
- https://doi.org/10.1021/la00036a048
Abstract
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