The dependence of elemental yield variance on detector type through mathematical modeling
- 1 April 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 37 (2) , 931-935
- https://doi.org/10.1109/23.106738
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
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