Matching properties, and voltage and temperature dependence of MOS capacitors
- 1 December 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 16 (6) , 608-616
- https://doi.org/10.1109/jssc.1981.1051651
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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