Generating test data with enhanced context-free grammars

1 July 1990

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Software

Vol. 7 (4) , 50-55
https://doi.org/10.1109/52.56422

Abstract

The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.

Keywords

This publication has 3 references indexed in Scilit:

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