Apparatus for the automatic measurement and recording of the variations of the electrical characteristics of a metal insulator semiconductor structure

This publication has 3 references indexed in Scilit:

• The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique
  Bell System Technical Journal, 1967
• Surface states at steam-grown silicon-silicon dioxide interfaces
  IEEE Transactions on Electron Devices, 1966
• Automatic Plotting of Conductance and Capacitance of Metal-Insulator-Semiconductor Diodes or Any Two Terminal Complex Admittance
  Review of Scientific Instruments, 1966