Quasi-resonance processes in the emission of excited secondary silicon ions
- 1 June 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 33 (1-4) , 547-550
- https://doi.org/10.1016/0168-583x(88)90627-1
Abstract
No abstract availableKeywords
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- Neutralization of ions at surfacesPhysical Review B, 1977
- Energy dependence of scattered ion yields in ISSJournal of Vacuum Science and Technology, 1976
- Oscillatory Cross Sections in Low-Energy Ion Scattering from SurfacesPhysical Review Letters, 1975