Phase response measurement technique for waveguide grating filters

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Abstract
A simple interferometric technique is described which can be used to accurately measure the phase response of waveguide grating filters. A narrowband, tunable Ti:sapphire laser is used in a Michelson interferometer configuration, where light reflected from a waveguide grating filter is combined with a reference beam. The intensity of the combined beams is measured as the wavelength of the Ti:sapphire laser is tuned. The measured intensity exhibits a quasisinusoidal wavelength dependence, from which the phase response of the filter can be deduced. This method is successfully demonstrated using both an integrated optic waveguide grating filter and a bulk grating pair. © 1995 American Institute of Physics

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