The Relation between Resonance Curves and Tip-Surface Interaction Potential in Noncontact Atomic-Force Microscopy
- 1 May 1998
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 37 (5A) , L533
- https://doi.org/10.1143/jjap.37.l533
Abstract
We present a perturbation theory which enables us to understand the physics of the cantilever-forced vibration in noncontact-mode atomic-force microscopy. Analytical expressions of the resonance curve and frequency shift are given. This theory is applied to the model system with a van der Waals tip-surface interaction potential. Based on this case study, it is elucidated how the resonance frequency shift is analytically described by an integral of the tip-surface interaction force over the traverse of the tip around the turning point. This quantity is rather sensitive to the interaction potential. We can see by this method how the dynamical instability occurs and significantly influences the observation of the resonance peak. Calculated resonance curves and frequency shifts agree fairly well with those obtained by a numerical integration of equation of motion outside the bistable region.Keywords
This publication has 15 references indexed in Scilit:
- Forces and frequency shifts in atomic-resolution dynamic-force microscopyPhysical Review B, 1997
- Development of ultrahigh vacuum-atomic force microscopy with frequency modulation detection and its application to electrostatic force measurementJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1997
- Role of Covalent Tip-Surface Interactions in Noncontact Atomic Force Microscopy on Reactive SurfacesPhysical Review Letters, 1997
- Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7×7Physical Review B, 1996
- Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspectsPhysical Review B, 1996
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force MicroscopeJapanese Journal of Applied Physics, 1995
- Forces affecting the substrate in resonant tapping force microscopyNanotechnology, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force MicroscopyJapanese Journal of Applied Physics, 1995
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991