New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference
- 1 November 1977
- journal article
- Published by Springer Nature in Applied Physics A
- Vol. 14 (3) , 319-323
- https://doi.org/10.1007/bf00882738
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Phase Shift Effects in Fringes of Equal Chromatic OrderJournal of the Optical Society of America, 1958
- Multiple-Beam Fringes of Equal Chromatic Order Part VIII Method of CoincidenceJournal of the Optical Society of America, 1958
- The Measurement of the Optical Properties of Zinc SulphideProceedings of the Physical Society. Section B, 1957
- Dispersion of Zinc Sulfide and Magnesium Fluoride Films in the Visible SpectrumJournal of the Optical Society of America, 1955
- Multiple-Beam Fringes of Equal Chromatic Order Part II Mechanism of Polishing GlassJournal of the Optical Society of America, 1953
- Multiple-Beam Fringes of Equal Chromatic Order* Part I Phase Change ConsiderationsJournal of the Optical Society of America, 1953
- XXXI New contributions to interferometry. Part V.—New multiple beam white light interference fringes and their applicationsJournal of Computers in Education, 1945