Single-electron thermionic-emission oscillations inp-nmicrojunctions

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Abstract
We show that Coulomb-blockade-type voltage oscillations exist in constant-current driven p-n microjunctions operated at temperatures below 3 K. These oscillations occur because of the regulation of the single-electron thermionic-emission events from the n layer into the p layer. We give an expression for the average I-V characteristics of the junction in the Coulomb-blockade regime, which agrees well with the results of the computer simulations. We also predict the generation of a regulated single-photon stream from such a p-n junction.