Electron Microscopic Study of Thin Films of the Aluminum-Copper Eutectic Prepared by a Melting Method
- 1 July 1960
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 31 (7) , 1287-1290
- https://doi.org/10.1063/1.1735819
Abstract
Thin films of the Al-Cu eutectic (67 wt% Al, 33 wt% Cu) were prepared by the melting method previously described and examined by electron microscopy. The lamellar structure of this eutectic was revealed so clearly that the contrast of the image obtained was comparable to that obtained by a replica method, which proved that the present film represented the same structure as the massive specimen. Electron diffraction study revealed which lamella belongs to the κ or θ phase and permitted the determining of the relative crystal orientation between two types of lamellas.This publication has 3 references indexed in Scilit:
- Dislocations and stacking faults in stainless steelProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1957
- Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin SectionsJournal of Applied Physics, 1949
- LXXIV.The diffraction of X-rays by an age-hardening alloy of aluminium and copper. The structure of an intermediate phaseJournal of Computers in Education, 1938