A study of the d.c. electrical properties of thin films of the co-evaporated dielectric system SiO/TiO
- 1 June 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 27 (2) , 319-327
- https://doi.org/10.1016/0040-6090(75)90039-5
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Some electrical properties of thin film copper–borosilicate glass–copper sandwiches intended for use as electron emittersInternational Journal of Electronics, 1974
- Electrical forming in and electron emission from thin film aluminium-borosilicate glass-aluminium sandwichesPhysica Status Solidi (a), 1972
- A model for filament growth and switching in amorphous oxide filmsJournal of Non-Crystalline Solids, 1970
- Electrical Breakdown in Thin Dielectric FilmsJournal of the Electrochemical Society, 1969