Micro PIXE and micro SXRF: comparison of the two methods and application to glass inclusions from Vulcano (Eolian Islands — Italy)
- 1 September 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 104 (1-4) , 481-488
- https://doi.org/10.1016/0168-583x(95)00472-6
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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