Small-angle X-ray scattering studies of a-Si1−xGex: H alloys
- 1 November 1992
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 150 (1) , 163-166
- https://doi.org/10.1016/0022-3093(92)90116-2
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Characterization of microvoids in device-quality hydrogenated amorphous silicon by small-angle x-ray scattering and infrared measurementsPhysical Review B, 1989
- Medium-Range Order of Amorphous Silicon Germanium Alloys: Small-Angle X-Ray Scattering StudyJapanese Journal of Applied Physics, 1989
- A SAXS study of V2O5·nH2O sols and gelsJournal of Non-Crystalline Solids, 1988
- Chemical Vapor Deposition of a-SiGe:H Films Utilizing a Microwave-Excited PlasmaJapanese Journal of Applied Physics, 1987
- Scattering from fractalsJournal of Applied Crystallography, 1987
- Structural, electrical, and optical properties of a-:H and an inferred electronic band structurePhysical Review B, 1985
- Density model for medium range order in amorphous materials: Application to small angle scatteringJournal of Non-Crystalline Solids, 1984
- Small-angle neutron scattering determination of medium and long range order in the amorphous metallic alloy TbCu3.54Journal of Physics F: Metal Physics, 1983