A Survey of Radiation-Induced Perturbations in Metal-Insulator-Semiconductor Structures
- 1 March 1971
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
- No. 07350791,p. 33-39
- https://doi.org/10.1109/irps.1971.362488
Abstract
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