Interferometric evaluation of thicknesses of thin films

• 1 January 1950
• journal article
• Published by EDP Sciences in Journal de Physique et le Radium
• Vol. 11  (7) , 373-374
• https://doi.org/10.1051/jphysrad:01950001107037300

Abstract

Keywords

• THIN FILMS
• THICKNESSES OF THIN
• INTERFEROMETRIC EVALUATION OF THICKNESSES