Semiquantitative X-ray microanalysis on preforms for optical fibres

1 March 1984

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 20 (5) , 208-209
https://doi.org/10.1049/el:19840138

Abstract

The distribution of the GeO₂-dopant in optical waveguides prepared by the VCVD process is determined with an SEM using energy dispersive microanalysis. A strong characteristic fluctuation of the GeO₂-density within each freshly deposited layer is observed. This original GeO₂-distribution is changed by interdiffusion and evaporation processes during the following steps of preform preparation and fibre drawing.

Keywords

ENERGY DISPERSIVE MICROANALYSIS
FRESHLY DEPOSITED LAYER
FIBRE DRAWING
FABRICATION
PREFORM PREPARATION
EVAPORATION PROCESSES
OPTICAL FIBRES
GEO2-DISTRIBUTION
GEO2-DOPANT
CHARACTERISTIC FLUCTUATION
SEM
X-RAY MICROANALYSIS
INTERDIFFUSION
VCVD PROCESS
OPTICAL WAVEGUIDES
GEO2-DENSITY
PREFORMS

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