Resolution and signal-to-background enhancement in gas-phase electron spectroscopy
- 1 August 1993
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (8) , 2179-2189
- https://doi.org/10.1063/1.1143957
Abstract
The most important factors contributing to line broadening and background intensity in electron spectra are identified and new design principles for high quality measurements are presented. It is shown that time‐dependent potential gradients in the gas cell are responsible for a large part of the ‘‘normal’’ line broadening, while scattering processes inside the gas cell are responsible for a large part of the background intensity. By designing the experiment according to these results, gas‐phase electron spectra can be recorded routinely at an instrument resolution level of better than 5 meV even at comparatively high gas cellpressures necessary to give high intensity for weak lines, and in principle unlimited counting times, at a much improved signal‐to‐background level. The resulting improvements in the spectral quality are demonstrated by spectra of Ar and HBr.Keywords
This publication has 29 references indexed in Scilit:
- A penetrating field electron-ion coincidence spectrometer for use in photoionization studiesMeasurement Science and Technology, 1992
- Optimization and redesign of an electron spectrometer for high-resolution gas phase UV photoelectron, Auger electron, and ion fragment spectroscopyReview of Scientific Instruments, 1991
- A high resolution threshold electron spectrometer for use in photoionisation studiesJournal of Physics E: Scientific Instruments, 1987
- Absolute total electron scattering cross sections forbetween 0.5 and 50 eVPhysical Review A, 1980
- Total cross section measurements for electron scattering from molecular hydrogen at very low energiesJournal of Physics B: Atomic and Molecular Physics, 1980
- The total absolute electron scattering cross sections for SF6 for incident electron energies between 0.5 and 100 eV including resonance structureThe Journal of Chemical Physics, 1979
- The origin and elimination of spurious peaks in threshold electron photoionization spectraJournal of Electron Spectroscopy and Related Phenomena, 1975
- Direct observation of rotational states of molecular ions in photoionization processesChemical Physics Letters, 1975
- A photoionization source of monoenergetic electronsReview of Scientific Instruments, 1974
- Photoionization resonance studies with a steradiancy analyzer. II. The photoionization of CH3IChemical Physics Letters, 1969