Investigation of the microstructure of the Al–Si eutectic in binary aluminium–7 wt% silicon alloys by electron backscatter diffraction (EBSD)
- 1 February 2001
- journal article
- Published by Elsevier in Journal of Light Metals
- Vol. 1 (1) , 43-49
- https://doi.org/10.1016/s1471-5317(00)00005-5
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Heterogeneous nucleation of solidification of Si in Al-Si and Al-Si-P alloysActa Metallurgica et Materialia, 1995
- Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern QualityMaterials Science Forum, 1994
- The role of non-cozonal twinning in the growth of fibrous silicon in strontium-modified Al−Si eutecticJournal of Materials Science, 1989
- The mechanism of silicon modification in aluminum-silicon alloys: Impurity induced twinningMetallurgical Transactions A, 1987