A Cantilever Microtome for Precision Sectioning in Electron and Light Microscopy

Abstract
A microtome has been built incorporating the principle of deflection of a cantilever to provide the highly reproducible motion necessary in cutting thin sections for electron microscopy. The prototype has been tested, and representative electron micrographs are shown. Alternative designs are discussed. Certain advantages are realized by the application of this principle. A simple construction with a minimum of precise machining readily provides an accurately reproducible motion. No sliding ways or lubricated bearings are needed. The effects of vibration, static friction, and thermal expansion are minimized. The instrument is easily adapted for cutting thin sections for light microscopy.

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