A method for determining the crystal orientation for any tilt position when using a transmission electron microscope double-tilt specimen holder
- 31 December 1990
- journal article
- Published by Elsevier in Micron and Microscopica Acta
- Vol. 21 (1-2) , 105-107
- https://doi.org/10.1016/0739-6260(90)90011-4
Abstract
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